As Semiconductor designs continue to scale in complexity and integration, ensuring that chips can be tested thoroughly and economically has become a strategic priority. Manufacturing defects, process variations, and subtle design issues can render even functionally correct designs unusable if they are not detected efficiently during production. Design for Testability https://judahelrwb.wikibestproducts.com/2117930/system_level_verification_as_a_critical_pillar_of_modern_vlsi_design